Translation of "Abweichung feststellen" in English

Accordingly the position of the shadow allows to determine any deviations thereof.

If you see a difference in the file name, you can simply rename it to "instrument_id.n26" on your computer.

On the basis of that comparison, control unit 130 is able to detect any deviation, and determine the resultant type and amount of reagents that need to be dosed.

Thus, for example, the sequences actually taking place could be compared with stored sequences so that any deviation can be detected.

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A customary portal monitor would therefore in this situation not detect any deviation or anomaly, and the averaged count rate 30 would be evaluated without testing the peculiarity of the incorrect temporal progression.

If you see a difference in the file name, you can simply rename it to "license_id.n25" on your computer.

Should the system detect deviations from a memorized reference master, a visual indicator alerts the operator and anomalies are displayed on a screen.

If visible deposits have formed inside the measuring cell, or if test measurements of your instrument with distilled or deionized water show inadmissible deviations from the target values, we recommend cleaning the measuring cell with a suitable laboratory cleaner (e.g. Mucasol®).

Every viable system, in nature or society, has numerous automatic feedback mechanisms that constantly compare their current state with a desirable goal state and set in motion corrective mechanisms if a deviation is detected.

If the control device in this respect finds deviations, it can output a fault signal.

The auditors found no critical deviations.

Contact a bicycle retailer if you notice any discrepancies.

That is why BSH uses prediction models at part level to identify and assess deviations.

Avoid contact with water as soon as you notice any damage or deviation.

From the perspective of the design and quality you can not detect any significant deviations to the original model.

If you notice big fluctuations in time on site, go for 5-10%.

Those departments or agencies shall withdraw the exemption where they detect anomalies or irregularities which could affect the conformity of bananas with the standards or where the conditions set out in paragraph 1 are no longer met.

Where it is necessary to amend actual sugar production on the basis of the information notified under paragraph 4, the resulting difference shall be taken into account in establishing actual production in the marketing year during which this difference came to light.

Under Article 103(3) of the Treaty, the Council is to monitor real implementation of the commitments undertaken by the Member States, with a view to identifying possible divergence.

We'll see what we have on the date the Russians shot this and the computer will overlay the two and identify any discrepancies.

Earlier analysis by Carley and Hall of the content of 51 voluntary agreements establishing EWCs found considerable variation in their provisions (Carley and Hall, 1996).

Once again, this means thatthe teacher or trainer has to analyse situations very carefully, identify changes and reactaccordingly.

For the processing of such products, an apparatus is already known in which the products, e.g. potato chips, are forced through a tube in a water stream flowing at known speed. The tube is transparent or translucent in at least one area, so that corresponding optical scanning arrangements can detect in said area, the presence of points having a differing coloring.

There is an increasing need for imaging methods in all areas of development and manufacture of micro-electronic and opto-electronic components in order to be able to visually evaluate micrometer structures, to identify deviations from rated patterns and to localize the defects produced on masks and wafers by particle occupation.

Description of the Prior Art There is an increasing need for imaging methods in all areas of development and manufacture of micro-electronic and opto-electronic components in order to be able to visually evaluate micrometer structures, to identify deviations from rated patterns and to localize the defects produced on masks and wafers by particle occupation.