Translation of "Soft error" in German

Since the charge is stored within the trench (5) and practically no soft error sensitivity should occur due to the use of a box insulation (13) between the neighboring trenches, the capacitance, set forth above, is certain to be adequately dimensioned.

If large-scale integrated circuits, for instance, semiconductor memories such as 16k or in particular 64k RAM's (Random Access Memories) are enclosed by such encapsulating compositions or provided with ceramic housings, the natural content of contaminating traces of radioactive thorium and uranium in the ceramic housings or in the inorganic filler causes so-called "soft-error" failures through alpha radiation.

SUMMARY OF THE INVENTION An object of the invention is to provide an electrically insulating encapsulation composition for semiconductor arrangements which prevents the occurrence of "soft error" failures in large scale integrated components and does not diminish the contact strength of the terminals.

By introduction of the silicon on insulator technique, as disclosed in the report by Ohkura, the soft error sensitivity is reduced and a small area requirement on the order of magnitude of 5 ?m2 is realizable. SUMMARY OF THE INVENTION

Due to the different absorption rates of the two monoenergetic photon energies in soft tissue and in bone, it is possible to determine the bone mineral salt content without soft tissue error.

As the push for ever-higher transmission rates has continued, Soft-Decision Forward Error Correction (SD-FEC) schemes have grown in popularity.

Another possibility is to use a number of identical modules in the transmitter so that the radar can continue to be used if one of the modules fails (Soft Error Management).

Here, the designations “soft error sensitivity factors” or “vulnerability factors” are also alternatively used.

Under the term soft error is referenced the distance which the received and digitalized signal had to the selected symbol, as well as the distance to the next most probable symbol.

For this reason, the semiconductor industry is following a trend away from conventional 6-transistor semiconductor memory cells to 1-transistor, 2-transistor and 3-transistor (1T, 2T, 3T) semiconductor memory cells, so that a high integration density, an improved yield and a lower so-called soft error sensitivity is obtained with reduced leakage currents.

In view of T. Lagerqvist, T. B. Minde, P. Mustel and H. Nilsson “Soft Error Concealment in a TDMA Radio System”, U.S. Pat. No. #5,502,713, December 1993, it must be pointed out that with the method illustrated herein, not only is one quality value used per receiving parameter, but 2 M, i.e. a reception probability exists for every possible transmitted parameter value. Furthermore in principle, the method makes no selection with the currently received parameter, but always operates up to the last parameter estimation 8 with signals that can be interpreted as a probability distribution.

Solved Google is emailing me about (404) soft errors ?!?

May co-authored the 1981 IEEE W.R.G. Baker Award-winning paper "Alpha-Particle-Induced Soft Errors in Dynamic Memories", published in the IEEE Transactions on Electron Devices in January 1979 with Murray H. Woods.

It has hitherto been necessary to use a complex and laborious test method to test memories which are provided both for storing data that are sensitive to errors as well as for storing data that are insensitive to errors, but which do not have an error correction function, for the absence of errors both as regards hard storage errors (hard errors, hardware errors) and as regards soft storage errors (soft errors, do not occur on each memory access).

If it is intended only to store data that are insensitive to errors, soft errors can be tolerated and the memory can be operated in the second mode of operation.

The ever decreasing feature sizes from semiconductor processes result in volatile semiconductor memories becoming ever more susceptible to what are known as soft errors.

The rate of occurrence of soft errors can be estimated for a newly developed memory in advance by virtue of said memory being subjected to increased suitable irradiation.

In this case, it is usually disregarded that addressing circuits and memory cells in a semiconductor memory that is present can be affected by soft errors in different ways.

These drives are subjected to hours of additional, stringent testing to check for soft errors, vibration, and other reliability predictors—just the sturdiest drives pass these tests and are prepared with special RAID-optimized firmware.

In the research area RF Subsystem and SoC Design advanced integrated analog and digital circuits will be developed under the conflicting regimes of flexibility and energy efficiency, taking into account constraints of future technology such as current leakage and soft errors.