Translation of "Abweichungen feststellen" in English

If the control device in this respect finds deviations, it can output a fault signal.

The auditors found no critical deviations.

Defects and deviations will be reported to the seller after detection.

Contact a bicycle retailer if you notice any discrepancies.

That is why BSH uses prediction models at part level to identify and assess deviations.

Avoid contact with water as soon as you notice any damage or deviation.

From the perspective of the design and quality you can not detect any significant deviations to the original model.

Those departments or agencies shall withdraw the exemption where they detect anomalies or irregularities which could affect the conformity of bananas with the standards or where the conditions set out in paragraph 1 are no longer met.

Under Article 103(3) of the Treaty, the Council is to monitor real implementation of the commitments undertaken by the Member States, with a view to identifying possible divergence.

We'll see what we have on the date the Russians shot this and the computer will overlay the two and identify any discrepancies.

Considerable differences — up to 100% — may be observed in the annual hours of teaching across the Member States.

Earlier analysis by Carley and Hall of the content of 51 voluntary agreements establishing EWCs found considerable variation in their provisions (Carley and Hall, 1996).

Despite the fact that most agreements mention core issues such as the economic and financial situation and employment and social issues, there is a significant divergence according to the home country of the MNC.

Once again, this means thatthe teacher or trainer has to analyse situations very carefully, identify changes and reactaccordingly.

There is an increasing need for imaging methods in all areas of development and manufacture of micro-electronic and opto-electronic components in order to be able to visually evaluate micrometer structures, to identify deviations from rated patterns and to localize the defects produced on masks and wafers by particle occupation.

Description of the Prior Art There is an increasing need for imaging methods in all areas of development and manufacture of micro-electronic and opto-electronic components in order to be able to visually evaluate micrometer structures, to identify deviations from rated patterns and to localize the defects produced on masks and wafers by particle occupation.

Through a comparison with a perfect image and its area coverage, respectively, (one-hundred percent coverage is not possible because of thesurface roughness of the stock), an image-processing system is able to detect and to display deviations and/or to derive control signals in accordance with stored algorithms.

Considerable differences ­ up to 100% ­ may be observed in the annual course load in the various Member States.

Micrometer size and and submicrometer size structrures are capable of being visually evaluated with the aid of scanning electron microscopes so that errors and deviations from the intended patterns are capable of being identified. Also, topographical data such as lengths, widths, heights or angles of inclination are capable of being acquired and interpreted.

Micrometer and sub-micrometer structures are capable of being visually evaluated through the use of scanning electron microsocopes, and errors and deviations from the desired patterns are capable of being identified. Topographical data such as lengths, widths, heights or angles of inclination of the structures are capable of being acquired and interpreted with scanning electron microscopes.

T (Time - Time): If you detect any of these anomalies, you should immediately call the emergency service and clearly notify that an ICTUS is being suffered, so that they activate the action protocol.

Also, several height profiles can be detected along several calibration lines to be able to determine, respectively exclude, potential deviations or errors.

This allows users to directly monitor the printing press printing and establish directly with deviations, which can be improved and to what extent improvement.