Übersetzung für "Coverslip" in Deutsch

Re-moisten with a drop of water and apply a coverslip.

Expressed differently, the coverslip or the window component is a part of the correction apparatus.

For example it may just be a coverslip or a foil.

The retention time until detachment of the coverslip is here measured each time.

Using forceps, carefully remove the coverslip from the previously hybridized targets.

Wash in gently running tap water, blot dry on tissue paper and apply a coverslip.

The wet sections were covered immediately with a coverslip and examined immediately afterwards under the microscope (see FIG.

The correction lens system can correct the imaging of water through the coverslip in water or air, for example.

For each total mass (coverslip with weight) the method is carried out at least ten times.

The flow was then derived from a suitable cell (which adheres to the coverslip).

When you’re finished counting, remember to clean the coverslip and counting chamber!

Pipette 5 to 10 µl of 0,1M phosphate-buffered glycerol (Appendix 3) or a commercially antifading mountant on each window and apply a coverslip.

Pipette 5 - 10 µl of 0,1M phosphate-buffered glycerol (Appendix 4) or a commercially antifading mountant on each window and apply a coverslip.

In the end, a mounting medium with an antifade reagent can be used to mount the sample onto the coverslip.

For example, materials naturally destined for release from the basolateral membrane may be shunted to other cell compartments in a coverslip model, making it difficult to resolve the mechanism of transcellular transport.

The coverslip should placed on the slide and edges sealed using wax or polish.

However, this advantage comes at the cost of a further, severe disadvantage because, as a result of using the separating layer system, for example, the coverslip or vessel bottom with adjoining air layer, extreme imaging aberrations such as spherical aberrations, coma and astigmatism occur even at low numerical apertures NA of e.g., 0.3 because of the oblique passage through the separating layer system and, accordingly, correct imaging is no longer possible when using standardized objectives.

In a method according to WO 2009/092555 A1 (see statements above), the interface between the coverslip and an aqueous sample embedding medium is also imaged onto the detector, the interface being imaged directly onto the CCD detector.

An “autofocus offset” of this kind requires that the distance between these two foci be known, for the example the coverslip thickness of a microscopic prepared specimen or the base thickness of a Petri dish in which the visually observed sample is located.

However, owing to the fact that the observation light or detection light must pass through the sample carrier or the coverslip thereof, extreme imaging aberrations such as spherical aberration, coma and astigmatism occur even at low numerical apertures such as NA=0.3 in water because of this oblique passage.

The spherical aberrations which are caused by the plane-parallel plate of the sample carrier or coverslip of the sample vessel are corrected simultaneously by the virtual relay when the required focal plane forms an angle not equal to zero with the normals of the large areas of this plate.

SUMMARY OF THE INVENTION It is the object of the invention to eliminate the imaging errors occurring when illumination light and detection light pass obliquely through the object carrier, the bottom of the sample vessel or a coverslip by means of a correction lens system which is as simple as possible and which in particular also enables continued use of existing objectives.

This allows simple retrofitting of existing objective sets with the correction lens system which must be adapted to the respective coverslip that is used.

The optical axes of the three objectives then form with one another by pairs an angle of 90° and are inclined by 45° with respect to the normals of the reference surface which is defined, for example, by a plane in which the vessel base or coverslip is located.

With regard to upright microscopes, FIGS. 4 a and 4 b can be imagined as upside down, with Petri dish base 15 then corresponding to a coverslip located on specimen 3 .

When the beamsplitter which is configured as a plane-parallel plate is regarded as sample carrier, the individual correction lens is arranged between the region of the sample to be imaged, i.e., the object plane or focal plane, and the sample carrier or coverslip.